Tobias de Jong
Leiden Institute of Physics
I am a physicist/material scientist/microscopist and I investigate electronic superstructures in Van der Waals materials, such as moiré patterns in twisted bilayer graphene as well as Charge Density Waves in Transition Metal Dichalcogenides, e.g. TaS2.
The main measurement tool for my research is a Low Energy Electron Microscope (LEEM), with which we are always trying to push the boundaries of what information can be extracted on the atomic and electronic structure of materials.
This means medium-large, just out of memory image and spectroscopic datasets, with its own domain-specific properties. Tools with which I try to analyse these datasets include, amongst others, Dask, Xarray, plain SciPy, scikit-image and scikit-learn.